Am-sam: a spatially-aware prompt learning and mask calibration framework for few-shot semantic segmentation

International Journal of Machine Learning and Cybernetics 2026 Open access

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Authors: Yuchen Li, Li Zhang, Youwei Liang, Pengtao Xie
DOI: 10.1007/s13042-025-02911-7
Cited by: 2
References: 34

Fields of Study & Subjects

Business Process Modeling and Analysis

Publication details

Journal / source
International Journal of Machine Learning and Cybernetics
Publisher
Springer Science and Business Media LLC
Volume
17
Issue
1
Publication date
1 January 2026
Language
EN