Dynamic evolution-driven domain adaptation with wavelet dual-path structure for cross-domain fault diagnosis

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Authors: Huikang Shen, Yawei Sun, Hongfeng Tao, Vladimir Stojanovic
Cited by: 1
References: 57

Fields of Study & Subjects

Machine Fault Diagnosis Techniques VLSI and Analog Circuit Testing Software System Performance and Reliability

Publication details

Journal / source
International Journal of Machine Learning and Cybernetics
Publisher
Springer Science and Business Media LLC
Volume
17
Issue
6
Publication date
24 April 2026
Language
EN