Dynamic evolution-driven domain adaptation with wavelet dual-path structure for cross-domain fault diagnosis
Fields of Study & Subjects
Machine Fault Diagnosis Techniques
VLSI and Analog Circuit Testing
Software System Performance and Reliability
Publication details
- Journal / source
- International Journal of Machine Learning and Cybernetics
- Publisher
- Springer Science and Business Media LLC
- Volume
- 17
- Issue
- 6
- Publication date
- 24 April 2026
- Language
- EN