Two-step mechanical etching of two-dimensional MoS2 flakes based on atomic force microscopy

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Authors: Jung Ho Lee, Yong Il Kim, Yerin Kim, S. S. KIM
Cited by: 1
References: 28

Fields of Study & Subjects

Force Microscopy Techniques and Applications 2D Materials and Applications Graphene research and applications

Publication details

Journal / source
Journal of the Korean Physical Society
Publisher
Springer Science and Business Media LLC
Volume
88
Issue
8
Pages
875–883
Publication date
14 January 2026
Language
EN