Recent Advances in Deep Learning-Based Interferometric Measurement

International Journal of Precision Engineering and Manufacturing-Green Technology 2026

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Authors: Jurim Jeon, Yangjin Kim, Kenichi Hibino, Naohiko Sugita, M. Mitsuishi
DOI: 10.1007/s40684-026-00868-8
Cited by: 2
References: 157

Fields of Study & Subjects

Advanced X-ray Imaging Techniques Optical measurement and interference techniques Digital Holography and Microscopy

Publication details

Journal / source
International Journal of Precision Engineering and Manufacturing-Green Technology
Publisher
Springer Science and Business Media LLC
Volume
13
Issue
3
Pages
1431–1462
Publication date
7 April 2026
Language
EN