Classical and Objective Bayesian Approaches to Estimating the Process Capability Index $$ C_{pc} $$ for the Dhillon Process Distribution

International Journal of Applied and Computational Mathematics 2026

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Authors: Sanku Dey, Abhimanyu Singh Yadav
DOI: 10.1007/s40819-026-02099-6
Cited by: 2
References: 30

Fields of Study & Subjects

Advanced Statistical Process Monitoring Statistical Distribution Estimation and Applications Reliability and Maintenance Optimization

Publication details

Journal / source
International Journal of Applied and Computational Mathematics
Publisher
Springer Science and Business Media LLC
Volume
12
Issue
2
Publication date
2 March 2026
Language
EN