Determination of $$^{235}$$U/$$^{238}$$U atom ratio by low-energy photon spectrometry with a silicon drift detector

Radiation Detection Technology and Methods 2026

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Authors: Hai Fei Zhang, Wei Chen, Wen Biao Liu, Xiao Long Huang, Wei Sheng, Xue Mei Wang, Dong Yang
DOI: 10.1007/s41605-026-00644-x
Cited by: 1
References: 9

Fields of Study & Subjects

Radioactive contamination and transfer Radioactivity and Radon Measurements Nuclear reactor physics and engineering

Publication details

Journal / source
Radiation Detection Technology and Methods
Publisher
Springer Science and Business Media LLC
Publication date
2 February 2026
Language
EN