Reliability Strategies for a-IGZO Thin-Film Transistors Under Stress Environments

Transactions on Electrical and Electronic Materials 2026

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Authors: Suji Choi, Yunhui Jang, Yumeng Guo, Y. T. Kim, Jang‐Kun Song, Junsin Yi
DOI: 10.1007/s42341-025-00693-x
Cited by: 3
References: 91

Fields of Study & Subjects

Thin-Film Transistor Technologies Organic Light-Emitting Diodes Research Nanomaterials and Printing Technologies

Publication details

Journal / source
Transactions on Electrical and Electronic Materials
Publisher
Springer Science and Business Media LLC
Volume
27
Issue
2
Pages
243–257
Publication date
6 January 2026
Language
EN