Body diode degradation study in EV SiC inverter topology under active/reactive loads

Journal of Power Electronics 2026

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Authors: Tianyang Wang, Qi Li, Dafang Wang, Jiuxiao Wang, Guohao Yang, Jinhuan Zhao

DOI: 10.1007/s43236-026-01297-1

Cited by: 0

References: 28

Fields of Study & Subjects

Silicon Carbide Semiconductor Technologies Multilevel Inverters and Converters Radiation Effects in Electronics

References 28