X-ray-based techniques for device analysis

Elsevier eBooks 2026 Book chapter

View at publisher
Authors: Abdul Basit, Sana Ramzan, Muhammad Raza Ahmad, Yasir Jamil, Hafeez Anwar
DOI: 10.1016/b978-0-323-88660-4.00003-x
Cited by: 0
References: 89

Fields of Study & Subjects

X-ray Diffraction in Crystallography Electron and X-Ray Spectroscopy Techniques X-ray Spectroscopy and Fluorescence Analysis

Publication details

Journal / source
Elsevier eBooks
Pages
437–476
Publication date
1 January 2026
Language
EN
Document type
Book chapter