MEMS X-ray source enables ultra-compact XRF spectrometry for in situ extraterrestrial surface analysis

Acta Astronautica 2026

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Authors: Paweł Urbański, Piotr Szyszka
DOI: 10.1016/j.actaastro.2025.12.052
Cited by: 1
References: 25

Fields of Study & Subjects

Planetary Science and Exploration X-ray Spectroscopy and Fluorescence Analysis Astro and Planetary Science

Publication details

Journal / source
Acta Astronautica
Publisher
Elsevier BV
Volume
241
Pages
192–198
Publication date
2 January 2026
Language
EN