Sulfur migration in silver: Insights from first-principles static and dynamic simulations

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Authors: Fernán Saiz
Cited by: 0
References: 72

Fields of Study & Subjects

Copper Interconnects and Reliability Electrocatalysts for Energy Conversion Semiconductor materials and devices

Publication details

Journal / source
Acta Materialia
Volume
314
Pages
122330–122330
Publication date
12 May 2026
Language
EN