Nonequilibrium defect-phase nanostructures stabilized by irradiation in undersaturated Ni-Si nanocrystalline alloy

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Authors: Amit Verma, Sourav Das, Yen-Ting Chang, Nicholas Saunders, Daniel Vizoso, Remi Dingreville, Marie Charpagne, Robert S. Averback, Pascal Bellon
Cited by: 1
References: 66

Abstract

Nanocrystalline thin films of the undersaturated alloy Ni-8.5 at% Si were subjected to 2 MeV Ti irradiation at temperatures ranging from 450°C to 550°C. Correlative microscopy combining transmission electron microscopy (TEM), scanning-TEM and atom probe tomography (APT) revealed that large dose irradiation at 450°C of samples with initial grain sizes below 100 nm stabilized a novel nanostructure which surprisingly contained three co-existing phases, the γ face-centered-cubic (FCC) matrix, γ ′ L1 2 ordered precipitates on intragranular dislocation loops and Ni 31 Si 12 precipitates at triple junctions (TJs). In contrast, irradiation at 550°C and irradiation of larger grain-size samples at 450°C only produced a γ − γ ′ two-phase coexistence. Analysis of the three-phase nanostructure and phase field simulations indicates that radiation-induced segregation is most pronounced at TJs, thus triggering the formation of Ni 31 Si 12 precipitates. These incoherent precipitates, in turn, appear to have contributed to stabilizing the grain size under irradiation. The results are generalized using the concept of driven defect-phases. It is suggested that the stabilization of driven defect-phases may impart radiation resilience by providing localized relaxation modes to the microstructure evolution during and after temporary perturbations in irradiation conditions.

Fields of Study & Subjects

Microstructure and mechanical properties Thin-Film Transistor Technologies Ion-surface interactions and analysis

Publication details

Journal / source
Acta Materialia
Publisher
Elsevier BV
Volume
314
Pages
122346–122346
Publication date
12 May 2026
Language
EN