Systematic modeling of atomic matching in incoherent and heterointerfaces
Fields of Study & Subjects
Advanced Materials Characterization Techniques
Ion-surface interactions and analysis
X-ray Diffraction in Crystallography
Publication details
- Journal / source
- Acta Materialia
- Publisher
- Elsevier BV
- Volume
- 316
- Pages
- 122460–122460
- Publication date
- 23 June 2026
- Language
- EN