FFDT-APNet: A frequency-fine-grained dual-teacher network with adaptive pruning for lightweight MFL defect detection

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Authors: Luyao He, Y. Zheng, Bin Liu, Jiawen Zhang, Jing Rao, Liang Yang
Cited by: 4
References: 29

Fields of Study & Subjects

Non-Destructive Testing Techniques Structural Integrity and Reliability Analysis Infrastructure Maintenance and Monitoring

Publication details

Journal / source
Advanced Engineering Informatics
Publisher
Elsevier BV
Volume
74
Pages
104786–104786
Publication date
14 May 2026
Language
EN