A computational study for screening high-selectivity inhibitors in area-selective atomic layer deposition on amorphous surfaces
Fields of Study & Subjects
Semiconductor materials and devices
Copper Interconnects and Reliability
Semiconductor materials and interfaces
Publication details
- Journal / source
- Applied Surface Science
- Publisher
- Elsevier BV
- Volume
- 730
- Pages
- 166294–166294
- Publication date
- 11 February 2026
- Language
- EN