In situ and nanoscale spectroscopic analysis of soft X-ray-induced transformations in indium nitrate films

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Authors: Seungchul Choi, Youngchan Kim, Hyun Su Park, Minseon Gu, Jaeyoon Baik, Jiho Kim, 최은집, Hyuk Jin Kim, Young Jun Chang
Cited by: 0
References: 53

Fields of Study & Subjects

Electron and X-Ray Spectroscopy Techniques X-ray Spectroscopy and Fluorescence Analysis Cultural Heritage Materials Analysis

Publication details

Journal / source
Applied Surface Science
Volume
732
Pages
166476–166476
Publication date
1 March 2026
Language
EN