Fast Cu-Cu pillar array bonding by thermally stable nanocrystalline Cu
Fields of Study & Subjects
3D IC and TSV technologies
Electronic Packaging and Soldering Technologies
Copper Interconnects and Reliability
Publication details
- Journal / source
- Applied Surface Science
- Volume
- 733
- Pages
- 166605–166605
- Publication date
- 15 March 2026
- Language
- EN