Trap-mediated current transport in tunneling layer of Ni/Al2O3/β-Ga2O3 diodes: effect of proton irradiation

Applied Surface Science 2026

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Authors: Yushan Song, L. Zhou, Teng Ma, Liang Chen, Hao Chen, Song Li, Zhifeng Lei, Xiaoping Ouyang

DOI: 10.1016/j.apsusc.2026.166671

Cited by: 3

References: 66

Fields of Study & Subjects

Ga2O3 and related materials GaN-based semiconductor devices and materials Photocathodes and Microchannel Plates

References 66