Electrical cycling induced evolution of internal resistance and interfacial capacitance distributions in PZT thin-film capacitors

Current Applied Physics 2026

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Authors: Tae Hoon Kim, Cheol Jun Kim, Min Kyung Ku, Taehee Noh, MinU Kang, MinU Kang, Hyeon Su Seong, Bo Soo Kang, Seung Jin Kang, Bo Soo Kang

DOI: 10.1016/j.cap.2026.01.008

Cited by: 0

References: 23

Fields of Study & Subjects

Ferroelectric and Piezoelectric Materials Ferroelectric and Negative Capacitance Devices Multiferroics and related materials

References 23