Fluorosilane-bridged high-reliability dielectric interfaces for Electrowetting application

Chemical Engineering Journal 2026

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Authors: Si Chun Yuan, Yuxian Xiao, Kai Xiong, Shiying Huang, Bo Zhang, Yuanyuan Guo, Hao Li, Meijin Zhang, Hailing Sun, Renfeng Dong, Laisheng Li, Yao Wang
+1 more Guofu Zhou
DOI: 10.1016/j.cej.2026.173160
Cited by: 1
References: 44

Fields of Study & Subjects

Electrowetting and Microfluidic Technologies Surface Modification and Superhydrophobicity Advanced MEMS and NEMS Technologies

Publication details

Journal / source
Chemical Engineering Journal
Publisher
Elsevier BV
Volume
529
Pages
173160–173160
Publication date
18 January 2026
Language
EN