Microstructure evolution of the 5 MeV Xe20+-implanted α-MoSi2 before and after annealing

Ceramics International 2026

View at publisher
Authors: Qing Chang, Qing ZHANG, Surui Xia, Chidong Liu, Laifei Cheng, Jia Yu
DOI: 10.1016/j.ceramint.2026.01.202
Cited by: 2
References: 42

Fields of Study & Subjects

Intermetallics and Advanced Alloy Properties Semiconductor materials and interfaces Titanium Alloys Microstructure and Properties

Publication details

Journal / source
Ceramics International
Publisher
Elsevier BV
Volume
52
Issue
8
Pages
10266–10277
Publication date
17 January 2026
Language
EN