Thermal shock–induced oxygen vacancy engineering in metal oxide electronics
Fields of Study & Subjects
ZnO doping and properties
Thin-Film Transistor Technologies
Electronic and Structural Properties of Oxides
Publication details
- Journal / source
- Ceramics International
- Volume
- 52
- Issue
- 10
- Pages
- 14744–14752
- Publication date
- 11 February 2026
- Language
- EN