A knowledge-driven adaptive meta-heuristic for wafer probing scheduling problem with resource-dependent and batch-processing machines
Fields of Study & Subjects
Scheduling and Optimization Algorithms
Assembly Line Balancing Optimization
Optimization and Packing Problems
Publication details
- Journal / source
- Computers & Industrial Engineering
- Publisher
- Elsevier BV
- Volume
- 217
- Pages
- 112062–112062
- Publication date
- 30 April 2026
- Language
- EN