A knowledge-driven adaptive meta-heuristic for wafer probing scheduling problem with resource-dependent and batch-processing machines

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Authors: Yifan Gao, Xinyu Li, Chunjiang Zhang, Zishun Hu, Qingsong Fan, Liang Gao
Cited by: 1
References: 46

Fields of Study & Subjects

Scheduling and Optimization Algorithms Assembly Line Balancing Optimization Optimization and Packing Problems

Publication details

Journal / source
Computers & Industrial Engineering
Publisher
Elsevier BV
Volume
217
Pages
112062–112062
Publication date
30 April 2026
Language
EN