High-throughput discovery of 2D van der Waals gate dielectrics by interpretable machine learning for sub-1-nm equivalent oxide thickness scaling

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Authors: Zhen Wang, Ming Chen, Ziqiang Xu, Jinshun Bi, Wenjun Xiao, Changsong Gao, Abuduwayiti Aierken, Gang Wang, Yan Wu, Liang Zhang, Degui Wang, Xuefei Liu
+1 more Mingqiang Liu
Cited by: 1
References: 49

Fields of Study & Subjects

Electronic and Structural Properties of Oxides Ferroelectric and Negative Capacitance Devices Machine Learning in Materials Science

Publication details

Journal / source
Colloids and Surfaces A Physicochemical and Engineering Aspects
Publisher
Elsevier BV
Volume
747
Pages
140856–140856
Publication date
19 May 2026
Language
EN