High-throughput discovery of 2D van der Waals gate dielectrics by interpretable machine learning for sub-1-nm equivalent oxide thickness scaling
Fields of Study & Subjects
Electronic and Structural Properties of Oxides
Ferroelectric and Negative Capacitance Devices
Machine Learning in Materials Science
Publication details
- Journal / source
- Colloids and Surfaces A Physicochemical and Engineering Aspects
- Publisher
- Elsevier BV
- Volume
- 747
- Pages
- 140856–140856
- Publication date
- 19 May 2026
- Language
- EN