The role of electron-phonon interactions on the electrical transport properties of metal interconnects

Computational Materials Science 2026

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Authors: Shumin Yan, Ruiling Gao, Shunbo Hu, Runhai Ouyang, Yin Wang
DOI: 10.1016/j.commatsci.2026.114605
Cited by: 0
References: 48

Fields of Study & Subjects

Copper Interconnects and Reliability Semiconductor materials and interfaces Molecular Junctions and Nanostructures

Publication details

Journal / source
Computational Materials Science
Volume
267
Pages
114605–114605
Publication date
27 February 2026
Language
EN