Non-destructive monitoring method for protected-lettuce yield using deep learning

Computers and Electronics in Agriculture 2026

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Authors: Xiaodong Zhang, Tingting Yu, Mohamed Farag Taha, Shenghan Zhou, Jin Zhou, Yixue Zhang, Yiqiu Zhao, Zongyao Cai, Jingjing Sun, Yuxiang Pan, Jianfeng F Ping
DOI: 10.1016/j.compag.2026.111516
Cited by: 0
References: 37

Fields of Study & Subjects

Smart Agriculture and AI Leaf Properties and Growth Measurement Remote Sensing in Agriculture

Publication details

Journal / source
Computers and Electronics in Agriculture
Volume
244
Pages
111516–111516
Publication date
5 February 2026
Language
EN