Incremental learning strategies for improved detection of unknown defects in wafer maps with limited samples

Computers in Industry 2026

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Authors: Tianming Ni, Jiang Wen, Huaguo Liang, Xiaoqing Wen, Mu Nie

DOI: 10.1016/j.compind.2025.104432

Cited by: 2

References: 26

Fields of Study & Subjects

Industrial Vision Systems and Defect Detection Advanced Neural Network Applications VLSI and Analog Circuit Testing

References 26