Atomic-scale scanning single-electron transistor microscopy for low-angle twisted two-dimensional heterostructures

Current Opinion in Solid State and Materials Science 2026

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Authors: Behnam Esmaeilzadeh, Hossein Chamkouri, Zubaida Rukhsana Usha, Syed Asad Maqbool, Muhammad Touqeer

DOI: 10.1016/j.cossms.2026.101263

Cited by: 3

References: 139

Fields of Study & Subjects

2D Materials and Applications Surface and Thin Film Phenomena Topological Materials and Phenomena

References 139