Investigation of N-polar GaN-diamond heterogeneous integration enabled by in-situ sputtered aluminum nitride interlayer
Fields of Study & Subjects
GaN-based semiconductor devices and materials
Thermal properties of materials
Silicon Carbide Semiconductor Technologies
Publication details
- Journal / source
- Diamond and Related Materials
- Publisher
- Elsevier BV
- Volume
- 162
- Pages
- 113310–113310
- Publication date
- 10 January 2026
- Language
- EN