Novel open fault detection of bypass circuit with IR camera-removal of dynamic disturbance by moving clouds

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Authors: Shogo Nishikawa, Hiro Kubota
Cited by: 0
References: 12

Abstract

One of the most popular existing technology for finding open bypass circuit to prevent hotspot is the measurement of surface temperature with an IR camera. However, this solution has defects. For example, thermal image is affected by the reflection of surrounding structure such as antenna and building, so on, and it is difficult to measure the true surface temperature of PV modules with IR camera. To solve the problems mentioned previously, we developed new detection technology for open fault of bypass circuit. The stationary state reflection effect is deleted, and the position of open fault part is identified exactly by the development technology. However, the reflection effect of moving clouds is not deleted perfectly. Therefore, we studied the advanced detection technology to delete the reflection effect of moving clouds. In this paper, the outline and effect of new proposed technology is described.

Fields of Study & Subjects

Photovoltaic System Optimization Techniques Optical Systems and Laser Technology Electrical Fault Detection and Protection

Publication details

Journal / source
Energy Reports
Publisher
Elsevier BV
Volume
16
Pages
109566–109566
Publication date
7 August 2026
Language
EN