Electron inelastic mean free path in MoO 3 thin films
Fields of Study & Subjects
Electron and X-Ray Spectroscopy Techniques
X-ray Spectroscopy and Fluorescence Analysis
Ion-surface interactions and analysis
Publication details
- Journal / source
- Journal of Electron Spectroscopy and Related Phenomena
- Volume
- 285
- Pages
- 147602–147602
- Publication date
- 9 February 2026
- Language
- EN