A shift-invariant deep learning framework for automated analysis of XPS spectra

Journal of Electron Spectroscopy and Related Phenomena 2026 Open access

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Authors: Issa Saddiq, Yuxin Fan, Robert G. Palgrave, Mark A. Isaacs, David J. Morgan, Keith T. Butler

DOI: 10.1016/j.elspec.2026.147624

Cited by: 1

References: 24

Fields of Study & Subjects

Advanced Electron Microscopy Techniques and Applications Machine Learning in Materials Science Generative Adversarial Networks and Image Synthesis

References 24