Data-model interactive prognosis framework for stochastic degrading devices under data-missing condition

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Authors: Qing Dong, Changhua Hu, Hong Pei, Jianfei Zheng, Jun Shang, Dangbo Du
Cited by: 3
References: 37

Fields of Study & Subjects

Advanced Battery Technologies Research Reliability and Maintenance Optimization Machine Fault Diagnosis Techniques

Publication details

Journal / source
Engineering Applications of Artificial Intelligence
Publisher
Elsevier BV
Volume
168
Pages
113899–113899
Publication date
31 January 2026
Language
EN