Spectrum-envelope attention-driven adaptive time-frequency enhancement network and its application in trustworthy cross-machine fault diagnosis

Engineering Applications of Artificial Intelligence 2026

View at publisher

Authors: Xin Kang, Zhengyang Cheng, Zhengyang Cheng, Yi Gong, Junsheng Cheng, Yu Yang

DOI: 10.1016/j.engappai.2026.114120

Cited by: 2

References: 35

Fields of Study & Subjects

Machine Fault Diagnosis Techniques Advanced SAR Imaging Techniques Engineering and Test Systems

References 35