Robust classification method for printed circuit board defects based on virtual and real space cooperative diffusion model

Engineering Applications of Artificial Intelligence 2026

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Authors: Xinyi Yu, Haotian Sun, Yuanfu He, Jinmin Peng, Xianping Zeng, Liangshen Chen

DOI: 10.1016/j.engappai.2026.114126

Cited by: 2

References: 49

Fields of Study & Subjects

Industrial Vision Systems and Defect Detection Neural Networks and Applications VLSI and Analog Circuit Testing

References 49