Electrolyte infiltration effects on the cracking of polycrystalline NCM cathodes

Engineering Fracture Mechanics 2026

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Authors: Yong Li, Yunpeng Guo, Yuwei Zhang, Yuwei Zhang, Yunhao Wu, Yue Kai, Kai Zhang, Fuqian Yang
DOI: 10.1016/j.engfracmech.2026.112036
Cited by: 2
References: 81

Fields of Study & Subjects

High voltage insulation and dielectric phenomena Electrostatic Discharge in Electronics Copper Interconnects and Reliability

Publication details

Journal / source
Engineering Fracture Mechanics
Publisher
Elsevier BV
Volume
338
Pages
112036–112036
Publication date
15 March 2026
Language
EN