SCID-Net: Few-shot deep-hole defect instance segmentation via multi-grained feature coupling and instance-aware inference decoupling

Expert Systems with Applications 2026

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Authors: Zongyang Zhao, Jiehu Kang, Yichen Xu, Jian Liang, Luyuan Feng, Yuqi Ren, Ting Xue, Bin Wu

DOI: 10.1016/j.eswa.2026.131341

Cited by: 1

References: 37

Fields of Study & Subjects

Industrial Vision Systems and Defect Detection Advanced Neural Network Applications Domain Adaptation and Few-Shot Learning

References 37