Integration of discriminant analysis with Artificial neural networks to decision analytic framework for enhancing automated visual IC inspection accuracy

Expert Systems with Applications 2026

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Authors: Tossapol Kiatcharoenpol, Sakon Klongboonjit

DOI: 10.1016/j.eswa.2026.131356

Cited by: 1

References: 47

Fields of Study & Subjects

Industrial Vision Systems and Defect Detection Advancements in Photolithography Techniques Surface Roughness and Optical Measurements

References 47