DSF-Unet: A dual-stream fusion denoising diffusion framework for imbalanced wafer defect classification

Expert Systems with Applications 2026

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Authors: Rongbin Xu, Zhiqiang Xu, Jixiang Wang, Ying Xie, Lijie Wen, Yun Yang

DOI: 10.1016/j.eswa.2026.131471

Cited by: 2

References: 25

Fields of Study & Subjects

Industrial Vision Systems and Defect Detection Generative Adversarial Networks and Image Synthesis Image and Signal Denoising Methods

References 25