A gas flow prover for in-situ calibration of semiconductor process gases based on rate-of-rise method

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Authors: Bin Zhou, Gaoming Zhang, Lei Xiang, Lan Jin, Yupei Zhang, Zhipeng Xu
Cited by: 1
References: 8

Fields of Study & Subjects

Flow Measurement and Analysis Advanced Sensor Technologies Research Scientific Measurement and Uncertainty Evaluation

Publication details

Journal / source
Flow Measurement and Instrumentation
Publisher
Elsevier BV
Volume
109
Pages
103236–103236
Publication date
31 January 2026
Language
EN