ReSAFT: An efficient stuck-at fault-tolerant scheme for ReRAM-based process-in-memory accelerators

Future Generation Computer Systems 2026

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Authors: Aniseh Dorostkar, Hamed Farbeh, Hamid Reza Zarandi

DOI: 10.1016/j.future.2026.108685

Cited by: 1

References: 50

Fields of Study & Subjects

Radiation Effects in Electronics Distributed systems and fault tolerance Parallel Computing and Optimization Techniques

References 50