Rapid early battery depletion and lead–electrode corrosion owing to CIED gate oxide semiconductor defects

View at publisher
Authors: Robert G. Hauser, Dawn Witt, Melanie J. Kapphahn-Bergs, J A Y Sengupta
Cited by: 0
References: 11

Fields of Study & Subjects

Cardiac pacing and defibrillation studies Orthopaedic implants and arthroplasty Quality and Safety in Healthcare

Publication details

Journal / source
Heart Rhythm
Volume
23
Issue
9
Pages
1992–1999
Publication date
26 February 2026
Language
EN