A dual-pathway physics-informed neural network approach for fatigue crack growth prediction under temperature-dependent R-effect

International Journal of Fatigue 2026

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Authors: Liyao Feng, Z.X. Li, Weiqing Huang, Weinian Guo, He Liu, Shiwei Han

DOI: 10.1016/j.ijfatigue.2026.109573

Cited by: 2

References: 43

Fields of Study & Subjects

Model Reduction and Neural Networks Fatigue and fracture mechanics High Temperature Alloys and Creep

References 43