Numerical analysis of structured illumination microscopy: Influence of illumination pattern geometry and fringe thickness on resolution enhancement

Optik 2026

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Authors: Ferhat Hanife, Azizian-Kalandaragh Yashar
DOI: 10.1016/j.ijleo.2026.172672
Cited by: 1
References: 38

Fields of Study & Subjects

Advanced Fluorescence Microscopy Techniques Digital Holography and Microscopy Near-Field Optical Microscopy

Publication details

Journal / source
Optik
Publisher
Elsevier BV
Volume
348
Pages
172672–172672
Publication date
12 January 2026
Language
EN