Spatial selection of ions separated in a multi-reflection time-of-flight mass analyzer

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Authors: Явор Михаил Игоревич, Kirill A. Koval
Cited by: 0
References: 17

Fields of Study & Subjects

Mass Spectrometry Techniques and Applications Ion-surface interactions and analysis Particle accelerators and beam dynamics

Publication details

Journal / source
International Journal of Mass Spectrometry
Volume
523
Pages
117607–117607
Publication date
5 March 2026
Language
EN