Interface thickness size effects on strength and shear localizations in Cu/Nb nanolaminates

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Authors: Mauricio De Leo, Nicolas Fuchs-Lynch, Justin Y. Cheng, Shuozhi Xu, Irene J. Beyerlein, Nathan A. Mara
Cited by: 3
References: 62

Fields of Study & Subjects

Microstructure and mechanical properties Copper Interconnects and Reliability Metal and Thin Film Mechanics

Publication details

Journal / source
International Journal of Plasticity
Publisher
Elsevier BV
Volume
199
Pages
104640–104640
Publication date
11 February 2026
Language
EN