Structure-preserving surface defect detection for flexible integrated circuit substrates

Image and Vision Computing 2026

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Authors: Zhiyan Zhong, Hongxin Wang, Changsheng Zhou, 康慧, Jianan Zhao, Yueming Hu

DOI: 10.1016/j.imavis.2026.106007

Cited by: 3

References: 43

Fields of Study & Subjects

Industrial Vision Systems and Defect Detection 3D IC and TSV technologies Surface Roughness and Optical Measurements

References 43