Defect detection for micro-LED by multi-illumination and deep learning

Infrared Physics & Technology 2026

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Authors: Qicheng Lina, Zhiguo Xieb, Kiyoshi Takamasuc, Meiyun Chend
DOI: 10.1016/j.infrared.2025.106357
Cited by: 1
References: 21

Fields of Study & Subjects

Industrial Vision Systems and Defect Detection Advanced Neural Network Applications Surface Roughness and Optical Measurements

Publication details

Journal / source
Infrared Physics & Technology
Publisher
Elsevier BV
Volume
154
Pages
106357–106357
Publication date
3 January 2026
Language
EN