TeOx interfacial passivation for Se0.3Te0.7 photoconductive detectors at 1550 nm

Infrared Physics & Technology 2026

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Authors: Jin Yang, Xiutao Yang, Jun Gou, Hang Yu, Zexu Wang, Wei Yuchao, Laijiang Wei, ChunYu Li, He Yu, HongXi Zhou, Yun Shen Zhou, Jun WANG
DOI: 10.1016/j.infrared.2025.106364
Cited by: 1
References: 18

Fields of Study & Subjects

Advanced Semiconductor Detectors and Materials Chalcogenide Semiconductor Thin Films Phase-change materials and chalcogenides

Publication details

Journal / source
Infrared Physics & Technology
Publisher
Elsevier BV
Volume
154
Pages
106364–106364
Publication date
1 January 2026
Language
EN