Investigation of the noise characteristics in cross blind pixels under long integration times

Infrared Physics & Technology 2026

View at publisher

Authors: Xu Yang, Bo Yang, Xue Li, Yizhen Yu, Runze Xia, Jinqiang Long, Guixue Zhang, Chunlei Yu, Xianliang Zhu, Xiumei Shao

DOI: 10.1016/j.infrared.2026.106512

Cited by: 0

References: 22

Fields of Study & Subjects

Advanced Semiconductor Detectors and Materials CCD and CMOS Imaging Sensors Infrared Target Detection Methodologies

References 22